Defect and Microstructure Analysis by Diffraction

15 March 2000

by R Snyder, J Fiala and H J Bunge, Oxford Science Publications, ISBN 0 19 850189 7 (£95, 780 pages).


In the International Union of Crystallography series of monographs, this comprehensive compilation of 31 chapters from different authors looks at the latest developments in X-ray diffraction techniques.

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